Used HITACHI S-9380 #293608918 for sale

HITACHI S-9380 is a scanning electron microscope that utilizes a high-performance electron source for superior imaging. It is ideal for a wide range of applications, such as observation of highly resolved microstructures, non-destructive analysis of various materials, and research of semiconductor processes. HITACHI S9380 offers superior image quality with high spatial resolution, as well as superior contrast as a result of its state-of-the-art robotic stage which captures various samples in view with great precision. S 9380 separates itself from other scanning electron microscopes with its large-performance field emission gun (FEG), which gives a superior range of observation with simultaneously high resolution and signal-to-noise performance. This allows for extremely high magnification with very low levels of beam deflection. S-9380 gives a greater range of observation than most similar models by targeting features as small as 3 nanometers. S9380 also utilizes a curved electrostatic lens design which gives a closer focus on the sample, resulting in improved resolution and flexibility in imaging. HITACHI S 9380 has plenty of features to assist studies through digital imaging. It comes with a Vacuum Reduction System (VRS) which allows for reduction of air flow in the chamber, resulting in improved image quality when scanning non-conductive samples such as biological tissue or vinyl. HITACHI S-9380 also includes a Secondary Electron Image Processing Tool (SEIP) which offers customized observation and control for detecting the most minute differences in surface characteristics. Additionally, HITACHI S9380 offers a wide range of imaging techniques, including semi-automated backscattered electron imaging, energy dispersive spectroscopy (EDS) for elemental analysis, electron backscatter diffraction (EBSD) for analysis of crystal structures, and cathodoluminescence imaging for observation of optical properties. S 9380 also utilizes AUTOMAP technology which allows for near instantaneous image switching between up to 12 preset imaging parameters, ensuring warp-free imaging and allowing the operator to obtain desired results faster. S-9380 offers an ergonomic control board which allows for quick, easy monitoring, imaging and measurement settings. The control board also permits macro setup parameters, such as multi-image scanning, filtering and quantification for large area studies. S9380, then, represents the state of the art in scanning electron microscopy. Its combination of advanced technology, imaging techniques, and user-friendly features provides users with an all-in-one solution for a variety of applications.