Used HITACHI S-9380 #9128308 for sale

ID: 9128308
Vintage: 2012
Scanning Electron Microscope (SEM) 2004 vintage.
HITACHI S-9380 scanning electron microscope (SEM) is a state-of-the-art instrument designed to obtain high-resolution images of non-conductive samples. It is suitable for a wide range of Life and Biomedical Science applications, such as NanoBio-Imaging, Cell Imaging, TEM Imaging, Cleanroom Imaging, 3D elemental mapping and EDS. HITACHI S9380 utilizes an innovative double beam technology based on a field emission gun (FEG) to provide improved imaging resolution compared to other SEM instruments. This is achieved by detecting electrons that travel along two separate pathways and form a third pathway due to interference. The combination of the three electric fields allows for a greater number of electrons to be detected, translating into superior image resolution. S 9380 also includes a host of other features and technologies that enable advanced imaging capabilities. A Frame Scanning technology creates dynamic images by rapidly scanning across the entire sample area, so that highly detailed images with true-to-life brightness and contrast can be generated. An integrated energy-dispersive X-ray detector (EDS) provides elemental composition mapping to reveal the exact elements that make up the sample structure. Furthermore, S9380 is equipped with auto-focus, auto-stig, and other features that make it easy to use. An intuitive control interface and convenient online tutorials allow users to quickly get up to speed on the instrument's operation. Various features have also been designed to ensure user safety, such as safety enclosure, safety glasses, and an emergency stop switch. Overall, HITACHI S 9380 scanning electron microscope is an advanced instrument that can provide exceptional imaging resolution and detailed elemental distribution maps. Along with its comprehensive range of features and user-friendly features, S-9380 is a great choice for researchers and engineers who require top-class imaging resolution and analysis capabilities.
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