Used HITACHI S-9380 #9167160 for sale

HITACHI S-9380 is a scanning electron microscope (SEM) designed for high resolution imaging and characterisation in a range of applications. It is equipped with high-sensitivity multi detector (HSMD) technology that allows for low magnification imaging, high resolution imaging, and simultaneous use of both electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) measurements. This makes HITACHI S9380 a versatile instrument that can provide analytical information to enhance imaging capabilities. S 9380 is capable of high resolution imaging down to 8 nm of resolution at low magnifications with secondary and backscattered electrons. This resolution is achieved due to the high brightness, high stability and high resolution of the microscope's electron gun. At high magnifications (up to 1000x) an electron probe diameter as small as 0.3 nm is possible. The probe current is automatically adjusted to provide the highest possible resolution. The SEM is equipped with a vacuum chamber with a base pressure of 1 x 10-7 Pa, allowing the observation of non-conductive samples that would otherwise be damaged by the electron beam. The chamber also has an automated gas injection system that allows the introduction of an inert gas to improve the vacuum stability and reduce charging of the sample. HITACHI S 9380 can also be used to make EBSD and EDS measurements while imaging. When making EBSD measurements, the detector is sensitive to both crystal structure and orientation of the material sample surface being observed. It can also be used to measure qualitative and semi-quantitative elemental distributions in the sample. S-9380 is ideal for use in materials science, microelectronics, material backscattering, semiconductor characterization, and a variety of other areas of research. It is simple to use, relatively low cost, and provides unbeatable resolution and contrast.