Used HITACHI S-9380 #9251784 for sale
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ID: 9251784
Wafer Size: 12"
Vintage: 2005
Scanning Electron Microscope (SEM), 12"
2005 vintage.
HITACHI S-9380 is a scanning electron microscope (SEM) that offers superior resolution imaging and analytical capabilities. HITACHI S9380's advanced design enables high-resolution imaging and nanoscale analysis of various materials. The microscope is capable of producing images in resolution up to 1 nanometer, providing detailed views of nanostructures and analysis of sample topography. S 9380 utilizes a variety of different electron sources to provide multiple analytical capabilities. A field emission gun (FEG) is used for high-resolution imaging, while a scintillator composite secondary electron detector (SCED) is employed to give an overview of the sample and a backscattering electron detector (BSD) enables analysis of topography. In addition, a photo detector and resistor detector are also available. The microscope is equipped with an automated specimen stage, which allows for high-speed navigation of the sample. It can be configured with an X-Y scanning unit to allow automated scan functions. S9380 also has an automated ion milling and sputter coating system, which enable surface analysis and metallization. In addition, HITACHI S 9380 is supported by a comprehensive suite of softwares that enable users to interact with images and analyze them in various ways. These include image processing software, 3D reconstructive software and integrated hardware-software systems. All of these features enable users to perform a wide range of functions, such as 2D and 3D imaging, automatic FE-SEM imaging, Z-contrast imaging, elemental analysis and much more. S-9380 is a powerful and versatile scanning electron microscope that offers superior imaging and analytical capabilities. Its advanced design allows for delicate and detailed studies of nanostructures and provides an array of analytical tools for various materials and applications. This cutting-edge technology enables users to explore a wide variety of materials and gain valuable insights into their properties, making it an indispensable tool for researchers in various scientific fields.
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