Used HITACHI S-9380 #9299017 for sale

HITACHI S-9380
ID: 9299017
Wafer Size: 6"
Critical Dimension Scanning Electron Microscope (CD-SEM), 6".
HITACHI S-9380 scanning electron microscope (SEM) is one of the most advanced and versatile instruments for imaging and characterizing a variety of materials and surfaces. HITACHI S9380 is ideal for users working in the fields of semiconductor materials and processes, failure analysis, packaging, optics, electronics, and many other applications. S 9380 is powered by an ultra-high resolution analytical equipment, offering 3.5 nm resolution in SE and 5 nm in BSE (Backscattered Electron) imaging, as well as a high dynamic range and large field of view. It comes equipped with a high-precision E-beam control system, allowing for highly accurate, repeatable imaging and characterization results. S9380 also features a special high-resolution energy-dispersive X-ray (EDX) measurement unit, allowing for rapid, high-precision elemental analysis with no special sample preparation, saving time and money. S-9380 is highly modular to meet a wide range of sample requirements, including different types of sample holders, cameras, detectors, and stages. The stages also provide excellent motion accuracy and reliability, with a maximum nanopositioning resolution of 0.5nm. This makes HITACHI S 9380 especially suitable for imaging extremely small samples and for high-magnification imaging. HITACHI S-9380 is also equipped with an in-column STEM (scanning transmission electron microscope) imaging machine, allowing for even higher resolution imaging and 3-dimensional imaging of samples. It has a variable pressure electron column, for imaging samples that need to be kept in a highly controlled environment. HITACHI S9380 can also be outfitted with an optional EDS spectrometer tool, allowing for even more rapid and precise elemental analysis with ultra-low X-ray detection limits. This Spectrometer asset also features energy filtering and multiple detector mounting options, allowing for improved signal-to-noise ratio and improved sensitivity. This makes S 9380 ideal for characterizing advanced materials and components. Finally, S9380 is highly automated, allowing for easy repeating and automation of scanning, imaging, and characterization tasks. The user-friendly user-interface and intuitive software makes operation simple and straightforward, saving time and helping to reduce errors. Overall, S-9380 is an excellent scanning electron microscope for examining and characterizing a variety of materials and surfaces, offering high resolution imaging, versatile sample holders and stages, advanced EDS spectrometer, as well as a user-friendly interface.
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