Used HITACHI S9380-2 #9351431 for sale

HITACHI S9380-2 is a scanning electron microscope (SEM) enabling users to observe the structure of samples with subpixel resolution. It supports observations in high vacuum, as well as at low and higher pressures. Additionally, a powerful imaging equipment can acquire SEM images with high contrast. This SEM features the secondary electron detector Schottky emitting electron detector for more detailed imaging. Additionally, the detector is installed in the Corrected High Efficiency Low Energy Electron Detector (CHELEX) holder, resulting in high durability and reliable imaging. It's equipped with dynamic focus technology, making it easier and faster to obtain high-resolution images. S9380-2 system offers a variety of features for higher signal processing and analysis. These include a motorized sample stage, automatic control of beam current and width, variable-shaped beam adjustment, and more. The advanced video-processing unit and user-friendly functions contribute to higher-quality images in less time. Spectral X-ray analysis acquisition and measurement allow users to analyze samples in more detail when used with an Energy Dispersive X-ray Spectrometer. HITACHI S9380-2 machine has a high-precision Oxford InTouch bruker detector and an AXSY2 Pre-scanning tool for automatic image acquisition. The AXSY2 can compensate for the instability of the beam spot, providing an ideal imaging environment. Its high-speed data acquisition can dramatically reduce acquisition time for high-definition images. A computer-aided image acquisition asset is also included in S9380-2, allowing the user to adjust the area-of-interest (AOI) and scan range. The model can store the parameters of each AOI for later use, and offers multiple image-capture modes such as wide-area imaging, multi-angle imaging and single-shot imaging. The equipment has an optional auto-polarity function that can be programmed to capture images of both the positive and negative sides of the sample. It is equipped with a seven-axis Eucentric arm system to access the arbitrary scanning angles needed. Other optional features include a low vacuum unit (LVS) and super-high speed shuttle injection machine (SSFIF). The tool includes an optional high-efficiency interface for controlling the SEM remotely. This allows users to control the SEM from a remote location, giving them the flexibility to perform various operations without having to travel to the machine. Additionally, the asset supports Ethernet communications for data transfer, allowing real-time data acquisition and analysis. For sample protection, HITACHI S9380-2 SEM offers optional Filtepoint TM Filters that reduce the amount of charged particles and debris emitted from the sample. It also includes special mounting stages and accessories for easy handling of samples. For sample preparation, S9380-2 is compatible with a variety of sample holders including stubs, MEMS sample support and nanoparticle sample holder. These features make HITACHI S9380-2 ideal for a range of research applications in the fields of semiconductors, thin films, materials science, nanotechnology, biology and many other areas. It provides powerful imaging and analysis capabilities, enabling users to observe samples with subpixel resolution for greater detail and accuracy.