Used HITACHI Scanning Electron Microscope (SEM) #293672028 for sale

HITACHI Scanning Electron Microscope (SEM) is a powerful analytical tool able to view samples with extremely high magnification levels and unparalleled detail. In scanning electron microscopy (SEM), a rapidly scanning primary electron beam sweeps over a surface generating a variety of secondary signals which are then analysed to create a detailed image of the sample. The SEM is equipped with a tungsten filament electron source, with the electron beam accelerated to between 1-20 kilovolts. The beam is focused into a beam size of between 0.5-2.0 microns which allows for extremely high resolution analysis. The interaction of the beam with the sample generates secondary electrons, backscattered electrons, Auger electrons, X-rays, and cathodoluminescence which are detected by an array of electromagnetic detectors or a charge couple device (CCD) camera. Special lenses can be applied to the beam to create a stereo image which is particularly useful for three dimensional analysis. The SEM also comes with several accessories which can used to analyse the sample further. One such device is the energy dispersive X-ray (EDX) spectrometer which provides a qualitative and quantitative elemental composition of the sample being studied. The charge coupled device (CCD) camera provides images for off-line analysis and archiving. HITACHI SEM also opens up a host of imaging techniques, such as secondary and backscattered imaging, phase contrast imaging, and low-voltage imaging. This provides an extensive range of sophisticated imaging capabilities that allow for the analysis of various properties associated with the sample. Advantages to HITACHI SEM include high resolution imaging capabilities, a wide array of imaging techniques, automated sample preparation and analysis, large depth of field and resolution, and it's ability to allow for excellent contrast, brightness and colour at a magnification of up to 1 million. With its superb imaging resolution, HITACHI SEM has become increasingly popular with universities, research institutes and industry for its many application including materials research, metallography, microfabrication, and art conservation. It is an extremely effective tool for examining the features and properties of a sample and providing incredible detail on the structure of a sample.