Used HITACHI SPC-100B #9352395 for sale

HITACHI SPC-100B is an advanced scanning electron microscope (SEM) designed for use in a variety of laboratory research applications. The unit features an accelerated voltage range of 0.5-75 kV, a high-resolution digital imaging CCD (charge-coupled device) camera, and a high-resolution digital image storage equipment. HITACHI SPC-100 B is capable of producing ultra-high-resolution images with a resolution of up to 2,500× magnification. The unit has a large working space with an X-Y scan maximum size of 250 mm and a Z height of up 120 mm. SPC-100/B utilizes an innovative particle and sample movement control system which allows for high-precision positioning and navigation of the scanning electron beam. HITACHI SPC-100/B is equipped with a secondary electron detector (HVSE) and backscatter electron detector (BSE). This allows for high-resolution imaging and analysis of difficult-to-image specimens such as metals and semi-conductors. The unit also features an ultra-high vacuum unit which eliminates contamination of samples by ambient air molecules. This machine is essential to producing high-resolution images which are free of contamination. SPC-100B utilizes a unique Cs-corrected LaB6 Filament which allows for more precise control of the electron beam. This tool helps to reduce image distortions and produces superior SEM images. The unit also features advanced error reduction technology which minimizes the effects of errors during imaging. This technology helps to produce images with improved geometric accuracy, resolution, and signal-to-noise ratio. SPC-100 B utilizes an advanced computerized image analysis asset which allows researchers to quickly assess the properties and anatomy of their sample specimens. This model also allows for user customization of imaging parameters and image processing functions. Overall, HITACHI SPC-100B is an advanced scanning electron microscope designed to help researchers produce high-resolution images of their samples with improved accuracy, resolution and signal-to-noise ratio. The unit is equipped with advanced imaging and error reduction technologies as well as sample movement control and imaging analysis systems.