Used HITACHI TM-3030 #9067359 for sale

HITACHI TM-3030 is a scanning electron microscope (SEM) that provides high-resolution imaging with high depth of field capability for a range of applications from semiconductors to biological samples. TM-3030 offers quick sample exchange with a 3-way specimen holder and a zero-maintenance, thermally-stabilized SE detector for stable imaging. A cold FEG (Field Emission Gun) source enables fast, high-contrast imaging through a variety of power and acceleration voltages. An auto-aligning system for the source and detector provide easy setup and maintenance. HITACHI TM-3030 incorporates a large-area detector for Wide Area Imaging (WAI). WAI provides large area overviews at low magnifications to reduce observation times without compromising resolution. A motorized stage with X-Y travel of 145mm x 100mm allows for high-throughput scanning for large samples or multiple points of interest. With the optional color mapping channel, TM-3030 is capable of producing 3D color images based on multiple components of the signal. This allows for better visualization of complex structures and greater detail. HITACHI TM-3030 also features a built-in particle analysis system which can be used to identify and size particles in a sample. The software can collect data on up to 1000 particles and provides stats on particle diameter, area, number, and surface roughness. TM-3030 is controlled by a user-friendly, intuitive software package that provides comprehensive image processing capabilities. This includes tools for enhancing contrast and brightness, sharpness adjustments, histogram readouts, region-of-interest measurements, and image overlap. HITACHI TM-3030 is an excellent tool for a wide range of applications such as failure analysis of integrated circuits, sample characterization in material science, and biological sample imaging. This powerful, reliable SEM provides excellent imaging resolution, speedy sample exchange, and easy to use software control.