Used HITACHI VR-70 #9165608 for sale
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ID: 9165608
Wafer Size: 6"
Vintage: 1989
Resistivity measurement systems, 6"
1989 vintage.
HITACHI VR-70 is an advanced scanning electron microscope (SEM) equipment that is designed for visualizing microstructures and materials. The system features an all-in-one design, and is ideal for high-resolution microscopy and spectroscopy applications. VR-70 boasts a Field Emission (FE) electron source, with an electron beam having a resolution of 0.2 nm (nanometers) and a current range of 0.2 - 1.5 nA. The electron beam has a creepage compensator design, which helps minimize the effect of drift caused by electrostatic interactions between the specimen and beam. HITACHI VR-70 has a scanning stage and a specimen chamber that are both enclosed in an environmental enclosure, which helps minimize the impact of environmental variables on microscopic measurements. In addition, the microscope includes a vacuum gap seal, which helps reduce the amount of electromagnetic interference which can interfere with imaging. Additionally, the unit features an integrated, multi-stage energy filter, which helps sharpen image resolution and remove unwanted secondary electrons or other signals. The microscope is equipped with high-definition monitors, lens-based optics, as well as digital imaging and automation software. The monitor is capable of displaying images up to 1920 x 1080 pixels at 10 bit color. The optics has a magnification range from 50x up to 100,000x, with a depth of focus of up to 200 nm. The user can view images through the monitor or directly through the eyepieces. The machine includes an acoustic-emission-attenuator (AEA), which helps reduce acoustic vibration while imaging. The systems' automation software can be used to capture and store images automatically, as well as to conduct multi-particle analysis. The tool also includes an image display software, which allows magnification, contrast, and brightness adjustment, as well as the application of image-processing functions. Overall, VR-70 is an advanced scanning electron microscope that has high-resolution imaging and spectroscopy capabilities. It's versatile design enables it to be used for a wide range of microscopy applications. The asset includes an FE electron source, environmental enclosure, image display software, and AE attenuator, making it an ideal choice for both industrial and research applications.
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