Used HITACHI WA 1300 #182689 for sale

HITACHI WA 1300
ID: 182689
Wafer Size: 12"
Vintage: 2010
Atomic Force Microscope, 12" 2010 vintage.
HITACHI WA 1300 is a scanning electron microscope (SEM) specifically designed for the observation of macro-objects which allows a wide range of analytical capabilities. It is classified as a SEM-FIB and combines the capabilities of a field-emission SEM with a focused ion beam (FIB) to create high-resolution images and analytical data. HITACHI WA-1300 utilizes a unique dual-stage design, which includes a main stage incorporating a field emission electron source, detectors, and a gun-aperture lens equipment, and a secondary stage with a focused ion beam (FIB) instrument. This allows for versatile operation, allowing the microscope to be used for both imaging and analysis. It is capable of generating high-resolution secondary electron images as well as compositional data through energy-dispersive X-ray spectroscopy (EDS). The inclusion of the FIB also allows for unprecedented ability to analyze samples, enabling high-resolution imaging, material composition analysis, and nano-fabrication. WA 1300 utilizes an advanced solid-state detector system that increases the resolution of SEM image-analysis to the nanometric level. The sensor consists of four split detectors that increase the signal-to-noise ratio and accuracy of the results. They also have an integrated signal processing unit that reduces signal noise and maximizes the resolution of the images. Additionally, an automated stage control machine allows faster and more accurate sample focusing and scanning. WA-1300 can also analyze samples with a wide range of magnifications. The microscope has an automated scanning stage that can handle samples up to 300 mm in diameter, and can be easily reconfigured for sample sizes up to 500 mm. It has an optical magnification range of 30X - 20,000X, with resolution down to 0.05 nanometers, and can achieve up to 50 nm of depth resolution. Overall, HITACHI WA 1300 is an advanced SEM-FIB that provides powerful analytical and imaging capabilities in a user-friendly package. Its dual stage design, comprehensive detector tool, automated scanning stage, and wide range of resolution and magnification options make it an ideal tool for a variety of research and industrial applications.
There are no reviews yet