Used HITACHI WA 1300 #9243647 for sale

HITACHI WA 1300 scanning electron microscope (SEM) is a high-performance tool for imaging, evaluating, and analyzing samples at the nanometer-level. It is a field emission SEM with a variable pressure control equipment, which makes it suitable for use in a range of applications such as sample surface characterization and analysis, elemental composition analysis, and 3D-morphological measurements. The system is equipped with an electron gun, condenser lenses, imaging lenses, and a sample chamber. The electron gun produces a narrowly focused electron beam which is then passed through the condenser lenses to the sample chamber, while the imaging lenses capture and magnify the image of the sample. The sample chamber itself provides the variable pressure control, allowing the user to adjust the pressure to obtain the optimal imaging or analysis results. The imaging unit is highly versatile, with features such as high-resolution imaging, high-depth of field imaging, and an automated analysis machine. The high-resolution imaging enables the user to make detailed observations down to the sub-nanometer level, while the high-depth of field imaging allows for simultaneous observation of features up to 3D level. The automated analysis tool can be used to quickly identify numerous properties of the sample, such as its surface roughness, true grain size, elemental composition, and microstructural features. HITACHI WA-1300 is capable of operating in a range of imaging and analysis modes, including secondary electron imaging (SEI) and backscattered electron imaging (BSEI). SEI can be used to observe the surface features of a sample, while BSEI provides a deeper view of the structures and elements within the sample. Both of these imaging modes are highly versatile, and can be combined with other analysis functions in a single automated process. In addition, the asset offers a range of analysis functions such as EDS X-ray mapping, particle size analysis, and spectral microscopy. EDS X-ray mapping can help the user identify the elemental composition of a sample at the point of analysis, while particle size analysis can be used for the characterization of fine particles. Spectral microscopy combined with the automated analysis model can provide detailed information about the chemical composition of a sample, and can be used to accurately identify and quantify trace elements. WA 1300 equipment is designed for fast and accurate sample analysis and imaging, providing the user with a powerful tool for studying and understanding various samples at the nanometer-level. Its combination of field emission SEM and variable pressure control system enables detailed observation and analysis, while the numerous imaging and analysis functions offer a range of options for researchers in fields such as material science, semiconductors, and more.