Used HITACHI WA 3300 #9211642 for sale

HITACHI WA 3300
ID: 9211642
Atomic Force Microscope (AFM) Wide area.
HITACHI WA 3300 is a high-resolution, monochromatic scanning electron microscope (SEM) designed for imaging small samples with a high degree of accuracy over a wide range of magnifications. This device is equipped with a large objective lens that allows for high resolution imaging. It has a 4k secondary electron detector (SE) detector and a backscattered electron (BSE) detector for high contrast imaging of elements such as carbon or silicon. The SEM also has a variable pressure equipment that allows for successful imaging of thin specimens without the need for additional reagents. HITACHI WA3300 has an oil-immersed objective lens with a field stop that enables stable imaging at high magnifications, from 50x to 10,000x. This device also features an autofocus function that constantly monitors the sample and adjusts the focus accordingly. The autofocus also has a spatial resolution of 0.01 nm, making it beneficial for imaging samples at the nano-scale. The SEM is also capable of measuring multiple elemental distributions in a single image due to its advanced energy-dispersive X-ray (EDX) system. WA-3300 has a straightforward user interface and can be operated with minimal training. This unit also has several utilities and software options that make automated measurements and imaging very easy. It is also a portable device for use in any type of laboratory, making it convenient for users who need to operate the machine in multiple locations. WA 3300 has an ultra-low background noise detector to capture high-resolution SEM images of weakly-contrasting specimens. Overall, HITACHI WA-3300 is a powerful SEM designed for imaging and analysis of a wide variety of small samples with exceptional accuracy and superb imaging quality. Its robust features and professional quality performance make it an ideal choice for use in any professional laboratory.
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