Used HITACHI WA 3300 #9232735 for sale

HITACHI WA 3300 is a scanning electron microscope (SEM) designed to provide high resolution imaging and analysis of various samples. It features advanced Abbe and field emission technology for optimized focus stability, improved image resolution, and improved operation speed and throughput. The primary column of the instrument is equipped with a field emission gun (FEG) and high voltage power supply, providing a greater depth of focus and reduced spherical aberration. This allows for higher resolution imaging and image stability over a wide range of magnifications simultaneously. The instrument can be operated with a variety of objective lenses, ranging from low magnification - ideal for large samples - to ultra-high magnification - perfect for detailed surface analysis. The Mass Analysis System (MAS) provides remarkably fast image acquisition, with a highly integrated primary and secondary column, featuring both an ultra-high performance delay line detector and a high stability secondary electron detector. The MAS also offers high sensitivity for observing a wide range of materials, such as semi-conductors, metals, and ceramic and organic materials. The Electron Beam Focusing System (EBFS) is a powerful and robust feature of HITACHI WA3300, allowing for convenient beam control for an optimal sampling beam by adjusting the beam transverse and longitudinal position. This feature is especially useful for samples with uneven surfaces or complex features. WA-3300 also features a unique imaging and analysis system, enabling real-time observation and optimization of the imaging parameters during imaging and analysis. The real-time electron beam optimization process simplifies the complexity of SEM operation, streamlining workflows for efficient operation and short analysis times. Finally, WA3300 houses a large selection of SEM accessories, such as automated sample preparation units, eucentric automated stage options, digital SEM image processors and various data analysis and acquisition systems. These components, combined with the ease of use and high levels of performance, make WA 3300 an ideal choice for a variety of sample analysis and imaging applications.