Used HITACHI WA 3300 #9244729 for sale

HITACHI WA 3300 scanning electron microscope (SEM) is an advanced imaging instrument used by scientists for research and analysis of a wide range of materials. It is capable of producing high resolution images of samples in the nanoscale range. HITACHI WA3300 uses a electron beam to probe and generate an image of a sample's surface structure. It is equipped with a newly developed "cold trap" which allows for sample preservation and more detailed imaging of soft samples. WA-3300 is a combination of various components including an electron source, an electron detector, a specimen chamber, a vacuum system, control and monitoring software and a user interface. The electron source is generated by an electron gun which can vary the acceleration voltage levels to study samples of different sizes and materials. The specimen chamber is under vacuum to minimize contamination and preserve the sample during imaging. The chamber incorporates an objective lens, a deflector and a stage to accurately position the sample at any desired angle. The electron detector produces images based on the electron signals generated from the sample. WA 3300 can also record images of various magnifications from low to high resolution. Its imaging capabilities range from conventional SEM images to transmission electron microscopy, Auger, secondary, X-ray spectra and ultra-low vacuum imaging. WA3300 also features an automated control and monitoring software to help users monitor, analyze and interpret data. The software can be integrated with a variety of computer programs to enable data sharing and collaboration. HITACHI WA-3300 is an ideal tool for scientists conducting research in materials science, nanoscience, energy science, biomedical science and more. It is a user-friendly instrument that can be used to study various samples with high imaging resolution. Its automated control and monitoring software also adds to its usability and overall performance.