Used JEOL JSM 5910LV #9314370 for sale

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ID: 9314370
Vintage: 2001
Scanning Electron Microscope (SEM) With THERMO SCIENTIFIC EDAX Chiller Heating / Cooling stage Column misaligned Heater replaced Operating system: Windows 2000 2001 vintage.
JEOL JSM 5910LV is a scanning electron microscope (SEM) designed for use in a wide range of applications. It has the highest resolution and highest magnification capability of any single column SEM in its class. JSM 5910LV utilizes an in-lens secondary electron detector, which is incorporated within the unit's electron optical column. This feature enables quick and accurate voltage adjustments to ensure optimum imaging conditions. The microscope is also equipped with a secondary electron detector and a channeltron detector, allowing for high-resolution imaging of non-conductive specimens. The microscope has a state-of-the-art cooling system that retains the vacuum and provides the necessary cooling to improve image quality and stability. Additionally, the unit has an advanced vacuum pump system with a close-loop function which monitors and maintains the level of vacuum for reliable operation. JEOL JSM 5910LV has a 168 mm maximum deflection angle of the electron gun providing a higher degree of accuracy and precision into the SEM imaging system. Additionally, the unit's multipurpose stage can be used for two-dimensional (X-Y) and three-dimensional (Z) navigation, allowing for precise specimen alignment and movement. It's possible to move specimens horizontally up to 150 mm and vertically up to 100 mm in order to obtain images of the desired area. The microscope also includes a high brightness EDX (Energy Dispersive X-Ray Spectrometer) detector which allows faster analysis of specimen elements at higher magnifications. In addition, a fine focus feature can incrementally adjust the image resolution and quality. Finally, JSM 5910LV includes a built-in software package called JEMWARE, which allows users to control their microscope operations from a PC interface. This package can be used to adjust settings such as magnification, focus, and contrast, as well as to analyze and measure scanned images. In summary, JEOL JSM 5910LV is a powerful scanning electron microscope with a wide range of features and advanced design components which make it suitable for many different SEM applications. It includes in-lens secondary electron detector, EDX detector, multipurpose stage for navigation and a built-in software package, among other features. The microscope provides high resolution imaging with high stability, making it an excellent choice for those who need accurate and reliable SEM imaging.
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