Used JEOL JSM 6301F #293628172 for sale

JEOL JSM 6301F Scanning Electron Microscope (SEM) is a high precision imaging equipment designed to provide maximum performance and convenience. This SEM has been designed around a monolithic one-piece column that minimizes vibration and increases stability, thus providing the user with a high level of productivity and imaging quality. JEOL JSM 6301 F is capable of a range of magnifications from 50x to 400,000x and an image resolution down to 0.5nm. It can be operated in both low vacuum and environmental mode and allows for a range of specimen holder options. JSM 6301F utilizes a thermally stabilized Schottky field emission electron source which extends its performance between 2-30kV. This source operates at a current of 1.2A while working at accelerating voltages of 3.2kV and results in an excellent signal-to-noise ratio. An automated lens alignment system ensures that the objective lens is always set up for optimal performance and reduces user intervention for optimal imaging. The electron optics of JSM 6301 F have been specifically tuned for maximum performance. The illuminated area of the sample is adjustable via a 3.2nm aperture and a condenser-illuminator objective lens. Also included is a tiltable dual-gradient field (DGF) lens unit that allows for precise control of the electron flow. This lens allows for precise imaging at high magnifications while maintaining a wide field of view. The specimen stage of JEOL JSM 6301F is height adjustable and provides a total scan range of up to 200mm while supporting a variety of specimen holders. A low vacuum mode allows for observing specimens without the need for prior preparation and also enables the microscope to be used for elemental analysis. An optional cryo-stage is also available for studying specimens at low temperatures. For maximum image quality and data analysis, JEOL JSM 6301 F is equipped with an integrated digital imaging machine. This allows the user to capture high quality images of specimens in real time and to instantly analyze them there after. The digital imaging tool also enables the user to transfer images to a PC for further analysis. An intuitive control interface allows the user to quickly set up the microscope and adjust parameters such as acceleration voltage, acceleration tilt, scan magnification and field of view. The software is designed to be user friendly and provides detailed instructions for setting up the microscope and acquiring images. Overall, JSM 6301F Scanning Electron Microscope is a reliable and precise imaging solution that provides users with an unrivaled level of performance and usability.