Used JEOL JSM 6700F #9373197 for sale

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ID: 9373197
Field Emission Scanning Electron Microscope (FE-SEM).
JEOL JSM 6700F is a high-resolution scanning electron microscope (SEM) designed for materials science and bioelectron microscopy applications. The SEM is capable of imaging micron-scale features with a high level of precision and detail due to its high resolution at its imaging energies of 1.0 to 30kV. The source voltage is adjustable and the maximum acceleration voltage can be up to 20kV. JEOL JSM 6700 F utilizes Secondary Electron (SE) and Back Scattering Electron (BSE) detectors for imaging, allowing for a wide range of imaging possibilities with excellent images and improved contrast. It is also equipped with an In-lens SE Detector, which allows for superior imaging of the upper section of samples, such as those found in materials and organic biology. The beam current is adjustable and the microscope is also capable of imaging different types of specimens, such as inorganic samples, nanomaterials, biological samples, and ICs. In addition, many special features accompany JSM 6700F, such as an in-column energy filter for imaging energy-sensitive samples, an auto focus system for quickly adjusting the imaging focus, a spill-free design for environmental safety and for imaging hazardous materials, and an EFI software for automated imaging and analysis. The included glassy carbon sample stage can be used for a wide range of imaging conditions and it can hold both wet specimens and samples heated up to 600°C. All in all, JSM 6700 F is an exceptionally precise and versatile SEM that is suitable for a broad array of applications in materials science and bioelectron microscopy.
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