Used JEOL JWS 7515 #136964 for sale

JEOL JWS 7515 scanning electron microscope (SEM) is the ideal analyzer for high-resolution observation and analysis of a wide variety of materials. The instrument utilizes a field emission electron source to scan a sample with extremely high resolution, typically under 150nm and a depth of field of approximately 4.5µm. The high-performance in-lens secondary electron detector provides the highest possible secondary electron images and the option to use an in-lens backscatter electron detector for coarse surface topography and composition mapping. The in-column BSE detector also produces higher signal-to-noise ratio images than STEM/BF detectors and is unmatched in terms of surface detail collection. Furthermore, JEOL SEM also features a high-precision, multi-position stage to automatically compare different areas of a sample, while two separate windows - one for the sample and one for the viewscreen - make it easier to observe and control the imaging. JEOL JWS-7515 is compatible with a host of options, including digital image recording (DIC) with a color video camera, real-time video processing, digital line scanning operation, 3D analysis and resolution settings, EDS (Energy-dispersive X-ray spectrometry), cathodoluminescence (CL), and EBIC (electron-beam induced current) detectors. With all these options, JWS 7515 is highly versatile and capable of imaging a variety of materials, from semiconductors to metallurgical samples. JEOL SEM has a highly user-friendly interface, allowing for faster sample exchange and spectrum collection, as well as real-time data acquisition and storage, faster remote control of the instrument and a large library of factory standard settings to make the operation of the instrument easier. Also, the micro-computer controlling the instrument always keeps the optimal performance, while JEOL SOFTWARE 2.0 software allows users to save and reuse the instrument settings, perform image overlays, and modify the video settings as desired. JWS-7515 is a powerful SEM designed to meet the needs of advanced laboratory analysis. It offers excellent resolution, exacting performance and state-of-the-art features that enable it to provide unparalleled imaging results of a broad range of materials.