Used JEOL JWS 7515 #9174206 for sale

JEOL JWS 7515 Scanning Electron Microscope (SEM) is an advanced tool for researchers. This SEM offers a variety of features to examine a wide range of material surfaces with detail and accuracy. Its unique design allows for a wide range of applications, from inspection of materials to nanotubular studies. JEOL JWS-7515 has an advanced field emission gun (FEG) for high-resolution imaging. Its maximum accelerating voltage of 5kV enables high resolution imaging at high magnifications. The device is equipped with a large, actively stabilized chamber which allows for the movement of samples up to 80mm in diameter. Additionally, the SEM has a powerful Post-column Energy Filter (PCEF) which enables accurate element identification. In addition to the high-resolution imaging capability, JWS 7515 has a variety of user-friendly features. It has user-friendly software, with automated collections and automated data analysis. Additionally, the system also offers automated drift correction with the FEG for improved image stability and repeatability. JWS-7515 has a robust automated sample stage with a wide sample range. It is capable of imaging non-conductive samples with its integrated variable pressure electron gun. Additionally, the equipment supports multiple detectors for collecting data from multiple angles. The device also offers a high-powered sample preparation station with three columns for easy sample loading. JEOL JWS 7515 also has a unique tilt control system which allows for adjustable tilt angles. This feature ensures the sample is adequately exposed to the electron beam and data is acquired even from difficult to reach samples. Finally, JEOL JWS-7515 is extremely reliable due to its advanced engineering. It is designed with features to protect the sample from damage due to electron irradiation. Additionally, the SEM is highly efficient in the filtering of electrons resulting in more reliable, high-quality data acquisition. In summary, JWS 7515 is a powerful scanning electron microscope that is equipped with a wide range of features and user-friendly software. It is capable of advanced imaging at high-resolution, as well as accurate element identification. Additionally, the SEM offers automated sample preparation and tilt control, as well as data analysis and drift correction. It is a reliable and robust tool that is ideal for researchers and engineers who require detailed imaging and analysis.