Used PHILIPS / FEI Inspect-F #9261821 for sale

PHILIPS / FEI Inspect-F is a scanning electron microscope (SEM) that offers a range of analytical capabilities for industrial, scientific, and academic use. This microscope is a substantial upgrade from previous generations of SEMs, offering increased resolution and imaging capabilities. FEI Inspect-F is an advanced scanning electron microscope equipped with a patented design that generates low-vibration, high-resolution imaging and advanced analytical capabilities. It utilizes a powerful turbo-pumped vacuum system for a wide range of imaging and analytical techniques, including secondary electron, backscatter electron, and X-ray microanalysis. The system is tailored to suit samples ranging in size from small sections to larger structures. The advanced electron optics are equipped with a smart auto-focus system that quickly and precisely focuses the beam of electrons to generate high-resolution images. The optics are designed to maximize throughput and reduce scan time, while also allowing for full dynamic image optimization. The large chamber size provides ample access to the sample for easy manipulations and navigation. PHILIPS Inspect-F also features a wide range of sophisticated instrumentation that provide a host of user-configurable options for a variety of analytical procedures. It can be equipped with annular dark field (ADF) imaging and energy-dispersive X-ray microanalysis (EDX) capabilities. The instrument includes a large collection of dedicated and interchangeable detectors, including electromagnetic energy filter (EIEF), energy dispersive spectrometry (EDS), and electron energy loss spectrometry (AES). The reliable operation of Inspect-F also allows for a wide variety of additional analyses, such as x-ray point analysis (XPA), photoelectron spectroscopy (XPS), particle induced X-ray emission (PIXE), and cathodoluminescence. The sample chamber is temperature-controlled for consistent imaging conditions, ensuring reliable results when analyzing samples of any type. Overall, PHILIPS / FEI Inspect-F is an advanced scanning electron microscope that offers a wide range of analytical capabilities, unparalleled resolution, and superior performance. Its computing power and instrumentation make it the perfect tool for industrial, academic, and scientific applications.