Used PHILIPS / FEI Quanta 200 #9307654 for sale

Name: PHILIPS / FEI Quanta 200
Brand: PHILIPS / FEI
SKU: 9307654
Availability: SoldOut

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Scanning Electron Microscopes

Manufacturer

PHILIPS / FEI

Model

Quanta 200

ID: 9307654

Vintage: 2003

Scanning Electron Microscope (SEM) Tungsten source Electron optics: Thermal emission SEM column With dual-anode source emission geometry Fixed objective aperture and through lens differential pumping Filament lifetime: > 100 Hours Resolution: High vacuum: 3.0 nm at 30 kV 4.0 nm at 30 kV 10 nm at 3 kV Low vacuum: 3.0 nm at 30 kV 4.0 nm at 30 kV <12 nm at 3 kV Extended vacuum mode (ESEM): - 3.0 nm at 30 kV (SE) Accelerating voltage: 200 V to 30 kV Probe current: up to 2μA Detectors: Everhardt thornley SED Low vacuum SED (LFD) Gaseous SED (GSED) IR-CCD Solid state BSED Vacuum chamber: High vacuum: < 6e^-4 Pa Low vacuum: 10 to 130 Pa ESEM Vacuum: 10 to 2,600 Pa Vacuum system: 240 l/s TMP, PVP Lens differential pumping Beam gas path length: 10 mm / 2 mm Chamber: Left to right: 284 mm Analytical WD: 10 mm (8) Ports EDX Take-off angle: 35° 4-Axis motorized stage: Eucentric goniometer stage X, Y: 50 mm Z: 50 mm (25mm motorized) T: -15° to +75° (Manual) R: 360° Continuous Repeatability: 2 μm System control: 32-Bit graphical user interface With keyboard and optical mouse Image display: 19" LCD, SVGA 1280 x 1024 Single frame / 4-Quadrants image display 4-Quadrants live Quanta started training CD Image processor: Up to 4096 x 3536 pixels File type: TIFF (8- /16-bit) Standard utilities: Digital video recording Temperature control Image histogram and measurement System option: PC and LCD, 19" Monitor and DVD R/W Multi-functional control panel Controlled Pettier cooled Specimen stage Controlled 1000°C heating stage Controlled 1500°C heating stage Remote control Video printer Specimen holder kit EDS WDS EBSD Stray AC magnetic fields: Asynchronous: < 100 nT Synchronous: < 300 nT Power consumption: < 2.0kVA for basic microscope Temperature range: 15-30°C Relative humidity: Below 80% RH Door width: 90 cm Operating system: Windows XP No compressed air or water cooling Power supply: 230V (+6%, -10%), 50/60 Hz (+/- 1%) 2003 vintage.

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PHILIPS / FEI Quanta 200 scanning electron microscope (SEM) is an advanced imaging tool for evaluating the structural characteristics of surfaces and small objects at very high magnifications. With a built-in STEM detector, it allows for detailed analysis of both non-conducting and conducting samples. FEI Quanta 200 is equipped with an easily adjustable twin lens column, which enables the user to accurately sample a wide range of samples at various magnifications. It has an advanced analytical system for highly detailed image analysis, such as automated particle sizing analysis and automated elemental analysis. It also utilizes an advanced imaging system with a range of backscatter detectors, allowing for high resolution imaging of sub-micron specimens. It features an in-column analytical system that can detect and count a wide variety of particles and molecules in samples. PHILIPS Quanta 200 features a high-performance electron optics for higher resolution SEM imaging. Its high-energy electron gun produces up to 200kV beam currents, providing an excellent depth of field and image contrast. It also has high- angle magnification capabilities, enabling the user to see hidden structures or details even at certain high magnifications. Quanta 200 is equipped with a sample holder that can accommodate a variety of sample types, including conductive and non-conductive specimens. It also has a range of electrode options, including a cooling stage and a temperature monitor. This allows for more accurate detection of elemental information. PHILIPS / FEI Quanta 200 is designed to be user friendly and it includes a tutorial function to guide users through the imaging and analysis processes. FEI Quanta 200 is an excellent imaging tool for those who need to analyze minute details and identify hidden features or structures even at extremely high magnifications. It's a reliable and efficient scanning electron microscope that can provide a vast array of detailed images and data. It is perfect for those looking to analyze any kind of sample, from components and parts to biological specimens.