Used PHILIPS / FEI XL 30 #9236587 for sale

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ID: 9236587
Scanning Electron Microscope (SEM) Operating system: Windows 3.1 Source: Tungsten hair pin type Vacuum system: Diffusion pump type Detector: SE and BSE Detector Auto stage option Missing parts: Diffusion pump system TMP and vacuum interface PCB SE-Detector unit Rotary pump PC System.
PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) produced by FEI corporation. This model of SEM is a secondary electron microscope, which is optimized for operation with a wide range of samples, sizes, and materials. It is capable of producing high-resolution, 3D images of objects through the use of an electron beam that is focused onto the sample. FEI XL 30 is known for its accuracy and precision in imaging objects, which is due in part to a design that integrates environmental capability with a digital imaging and control equipment. This system allows for a high degree of control in setting up the microscope and capturing images. The x-y stage for PHILIPS XL30 can move up to 175mm in either direction, and it has a maximum speed of 50mm/s. It also has a variable pressure chamber for controlling the environment in which the sample is viewed, which can be adjusted between two to six thousand pascals. A power booster provides acceleration voltages from 10KV to 30KV, allowing for a wide range of operating conditions. The unit also comes with an automated stage controller that allows for automated movement of the stage. This can be adjusted by the user, and the microscope has an automatic sample balance machine that keeps the sample surface level at all times. The primary imaging tool of the microscope is comprised of a secondary electron detector, which provides a high level of contrast in the images that the microscope produces. Additional features of the asset are its integrated scintillator and its adjustable pressure sensor, which allows the user to monitor the pressure of the sample chamber. FEI XL30 is also equipped with a scan converter, which converts the incoming electron beam into digital signals so that the images can be displayed on a computer monitor. Additionally, the model comes with an automated microscope imaging injection control that allows for imaging on autocorrelation times scales of up to five seconds. This model of SEM is ideal for a wide range of applications, from educational and research purposes to industrial purposes. Its environmental control capabilities, imaging accuracy, sensitivity, and automated options make it a reliable choice for users from a variety of backgrounds.
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