Used PHILIPS / FEI XL 30 #9242267 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) that is renowned for its superior performance and reliability. Its high-resolution imaging and analysis capabilities make it a desirable tool for researchers working in nanoscience and related fields. FEI XL 30 utilizes field emission electron optics and distortion-free, high-voltage electron gun to produce images of superior resolution, allowing for complicated particle imaging tasks to be completed with ease. PHILIPS XL30 has a detection signal-to-noise ratio of up to 4000:1, making it one of the most sensitive and highest-performing scanning electron microscopes on the market. XL 30 features a fully-automated specimen exchange system, making switching between samples quickly and conveniently. It also boasts a powerful analytical and imaging suite, which allows for protometric analysis, EDS spectroscopy, imaging in backscatter, brightfield, and darkfield modes, as well as elemental mapping, particle quantification, layer thickness measurement, and morphological characterization. XL30 has an adjustable working distance from 1 µm to 300 µm, enabling a variety of imaging techniques. Additionally, FEI XL30 can be used with a wide range of accessories and sample holders to meet the needs of almost any microscopy application. PHILIPS / FEI XL30 scanning electron microscope is an incredibly reliable, high-performance tool that enables scientists to perform detailed imaging and analysis at the nanoscale. With its cutting-edge electron optics and versatile array of accessories, PHILIPS XL 30 is an ideal particle imaging solution.