Used AMAT / APPLIED MATERIALS SemVision G2 #9211547 for sale

AMAT / APPLIED MATERIALS SemVision G2 is a mask and wafer inspection equipment that combines enhanced imaging and scanning performance with advanced defect detection and classification capabilities to enable fast and accurate characterization of all mask and die defects. The system is designed to detect anomalies in a single-zoom or multi-level inspection. It also offers advanced algorithms to detect previously unseen defects or process flaws. The unit includes a wafer/mask-viewer with an integrated laser scanner for high resolution magnification and imaging. AMAT SemVision G2 has a small, lightweight form factor and convenient use, making it the ideal choice for both benchtop and semiconductor fab environments. It features high-powered LED lighting for improved contrast and a sophisticated optical machine for fast and accurate inspection. An integrated wafer/mask flatness inspection tool ensures that the mask and die surfaces remain planar and finish-leveled. The asset is designed to be easy to set up and calibrate, with a variety of options available for different inspection scenarios. This allows users to quickly inspect large volumes of diced devices in seconds. The inspection speed of the model is able to capture up to 1 million device images in a few minutes. APPLIED MATERIALS SemVision G2 also offers support for Auto Defect Review (ADR) to improve defect characterization accuracy. SemVision G2 equipment also supports defect imaging, allows users to view multiple images of a defect in both wafer surface and cross sectional mapping. This helps in accurately classifying the defects according to the shape, size, and location of the devices. The system also supports various types of defect detection algorithms such as rule-based, pattern matching, and image analysis to better identify and characterize defects. Additionally, the unit also offers real-time co-site imaging capabilities for rapid and precise defect inspection. AMAT / APPLIED MATERIALS SemVision G2 machine provides fast turn-around time, excellent repeatability, and precise equipment performance. With an integrated editor, users can quickly review the inspection images, create mask and wafer layout diagrams, and adjust the image contrast and brightness. An intuitive user interface also provides clear information regarding defect coverage and clarity of defects. With its enhanced capabilities and a variety of features, AMAT SemVision G2 is the perfect solution for mask and wafer inspection needs.