Used KLA / TENCOR 7000 / 7200 SURFSCAN #9100001 for sale

KLA / TENCOR 7000 / 7200 SURFSCAN is a wafer testing and metrology equipment that is designed to provide accurate, efficient and reliable wafer measurements. The system provides a high level of throughput and accuracy that is suitable for the demanding requirements of high-volume manufacturing. The unit can be used to measure a variety of parameters, including wafer film thickness, surface roughness and electrical properties. The machine is equipped with a carefully designed optical tool that is optimized to provide the necessary accuracy and precision for wafer tests. The asset consists of several scanning stations that are set up to enable the model to cover the entire wafer or multiple areas of the wafer at one time. The equipment also has an integrated datalogging station for storing test results and other data. The system includes a range of accessories for various types of wafer testing. These include a beam controller, an attenuator and a range of detectors. The beam controller is used to control the laser beam which is used to provide the necessary accuracy and precision for wafer testing. The attenuator is used to reduce the light intensity reaching the detector, allowing precise measurements to be taken. The detectors are used to receive and analyse the light reflected from the wafer. The unit is capable of performing a range of different types of tests, including optical property tests on wafers, including reflectivity, transmissivity and scatter measurements. The machine can also measure electrical properties, such as resistance, when paired with appropriate probes. The new KLA 7000 / 7200 SURFSCAN tool is capable of performing measurements that comply with industry-standard quality requirements. Furthermore, the asset provides advanced software that analyses data produced by the different wafer tests and displays it in a graph or chart format. The software can also provide a detailed report that can be used for further analysis. It is suitable for use in both laboratory and production environments and is easily integrated into existing production computations. Overall, TENCOR 7000 / 7200 SURFSCAN is an excellent model for wafer testing and metrology. It provides superior wafer testing accuracy and performance, and incorporates advanced software that can analyse data and produce a detailed report. The equipment is suitable for use in any environment, from laboratory to production.