Used CAMECA IMS WF #9311805 for sale

CAMECA IMS WF (Ion Microprobe Secondary Ion Mass Spectrometer with Wide Field) is a state-of-the-art, field-portable instrument, suitable for a variety of applications in the fields of geology, geochemistry, environmental science, and nuclear materials characterization. It is a powerful tool for the analysis of trace elements, isotopes, and phase assemblages in small and large solid samples. CAMECA IMS-WF is equipped with three components: the Detector, Analyzer, and Column. The Detector contains a magnet that focuses ionized particles and detects them as they enter the Analyzer and the Column. The Analyzer separates the particles according to their mass and type, enabling IMS WF to collect specific data in order to effectively analyze a sample. The Mass Range of IMS-WF covers a wide range of masses (1-2500 Da), enabling the characterization of virtually any element. The Column of CAMECA IMS WF is composed of four parts: the Stage, Source, Sweep and Channeltron. The Stage allows for precise positioning of the sample and housing of the sources of ions. The Source injects the sample ions into the Column for analysis. The Sweep is responsible for moving the ions through the Column and the Channeltron allows for the detection of the ions. CAMECA IMS-WF uses Secondary Ion Mass Spectrometry (SIMS) to measure the amount and nature of ions in a sample. It utilizes a sample arm attached to an X, Y stage which scans a sample surface. As the sample arm moves across the surface, ions are ejected from the sample and detected by the Detector. This data is then analyzed by the Analyzer in order to determine the elemental composition of the sample. IMS WF is a versatile instrument, suitable for a wide array of applications including petrology, geochemistry, environmental science, nuclear materials characterization, and more. It is highly sensitive, fast, and accurate, and is capable of analyzing trace elements and isotopes. With its unique design and components, IMS-WF offers a reliable and complete solution for spot analyses in virtually any field.