Used KLA / TENCOR AIT XP #9253785 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

ID: 9253785
Wafer Size: 8"
Vintage: 2000
Inspection system, parts machine, 8" P/N: 200DSF2P PRE-200B-CE Pre-aligner ABM-407B-2-S-CE-S293 Robot ATM-100 Controller Dual finger end-effecter (Narrow type) Cassette interface: (2) ASYST LPT-2200 Indexers (SMIF), 8" P/N: 9700-6197-05 P/N: 9700-3260-05 CE Marked 2000 vintage.
KLA / TENCOR AIT XP is a wafer testing and metrology equipment designed to ensure high-quality production of semiconductor devices. The system is designed to inspect and verify wafer quality, by automatically testing and measuring physical electrical properties like thickness, dopant concentration, resistivity, film uniformity, grain structure, electromigration, defects, patterned structures, and die damage. The core of the unit is composed of optical microscopes, automated stages, and robot handlers. The microscopes contain the challenging optics, long-working distance, and extended working distance objectives. The automated stages are capable of moving the tool relative to the wafer and provide control of both stage coordinates and wafer tilt. Finally, the robot handlers are used to pick up and place wafers into the machine, and also change/load light sources. Additionally, KLA AIT XP also includes full image analysis software which provides analysis of automated test and measurements, as well as label-free defect detection, color filter defect detection, overlay measurements and analysis, and active stealth capabilities. This software is designed to maximise throughput and accuracy by leveraging the speed and accuracy of the hardware. The tool also provides the user with a comprehensive suite of reporting and data visualization tools. These tools allow for comparison of test results to identify trends, and also export detailed information to be used for wafer control charts, failure analysis, or other applications. In summary, TENCOR AIT-XP is the comprehensive wafer testing and metrology asset which provides a high level of accuracy and quality assurance through a range of automated testing, imaging and analysis tools. This model is highly versatile and can be used to investigate patterned structures, defects, film uniformity, resistivity, dopant concentration, and die damage. Thus, TENCOR AIT XP is the perfect equipment for ensuring high-quality production of semiconductor devices.
There are no reviews yet