Used DNS / DAINIPPON CV-8000 #9272450 for sale

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DNS / DAINIPPON CV-8000
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ID: 9272450
Wafer Size: 6"
CV Measurement system, 6".
DNS / DAINIPPON CV-8000 is a wafer testing and metrology system designed to provide accurate and reliable measurement of multiple parameters and features on semiconductor wafer surfaces. This system can handle various process steps related to wafer testing and metrology, such as Silicon-on-Insulator (SOI) wafer mapping, film deposition, and failure evaluation. It is designed for high-throughput applications and able to perform various test types, such as electrical, optical, thermal, and pressure characterization. DNS CV-8000 is built with a proprietary wafer testing and metrology architecture that has been improved and optimized for complex wafer processes. For enhanced stability and accuracy, it features an innovative double-stage, oil-separation technique, which helps to minimize fluctuations in measurement results during the testing process. It also includes a heavily-redundant and robust design, which provides critical protection against hardware failures, ensuring that measurements remain stable and reliable. The system also supports multiple industry standards, including those related to feature size and locations, film uniformity, and substrate characterizations. In addition to its reliable and accurate performance, DAINIPPON CV-8000 is designed for simple, flexible usage. It allows for easy setup and operation with the use of the intuitive graphical user interface, which provides comprehensive control over the testing process. It features a wide range of sensors, analytical instruments, sample loading systems, and lithography tools, allowing it to be customized and used in various wafer processes. It also offers a range of options, such as multiple illumination sources, automated defect classification, and image processing, in order to enable the user to best suit their testing requirements. CV-8000 has been tested and verified to withstand wide temperature ranges and environmental conditions, making it a reliable choice for wafer testing and metrology. Its state-of-the-art architecture makes it an ideal solution for efficient and accurate wafer testing and metrology, and its quick setup, ease of use, and high performance makes it a reliable choice for users looking for rapid and reliable results.
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