Used FILMETRICS F20 #9316076 for sale

FILMETRICS F20 high-speed, high-accuracy wafer testing and metrology system provides a comprehensive suite of tests that enables accurate measurement in a wide range of applications. FILMETRICS F 20 utilizes high-frequency confocal imaging to accurately measure three-dimensional physical properties of materials, enabling precise analysis for applications such as thin-film thickness, composition, and other optical parameters. The advanced hardware and software combination results in rapid measurement of multiple areas on any sample surface, from semiconductor wafers to cleanroom optics, which can be analyzed quickly and accurately. F20 operates with a powerful high speed Imaging Scanner module that is optimized for speed, precision and accuracy. Its 3D capability provides quantitative, mapping-level accuracy for the measurement of step heights and tilt angles. The high accuracy of F 20, paired with its industry-leading scan speed, make it ideal for real-time process control, allowing for extremely accurate analysis of any process step. FILMETRICS F20's high-resolution, three-dimensional topography maps are created by combining high-resolution vertical images and low-resolution lateral images of each sample area. The software constantly compares data points collected throughout the scan and provides feedback that is used to adjust the parameters accordingly in order to maintain optimal settings when compared to standard values. At the same time, linear features such as steps and edge profiles are automatically extracted and highlighted, providing an intuitive and quickly viewed representation of the surface at a pixel level. In addition to the Imaging Scanner module, FILMETRICS F 20 is equipped with a powerful Integrated Measurement Platform that consists of several other modules such as the Optics & Fluorescence Analyzer, the Advanced Spectrophotometer, and the Image Analysis & Calibration modules. In addition to providing extensive sample testing capabilities, the Advanced Spectrophotometer provides powerful data analysis for applications such as electroluminescence, OLED characterization, and CdSe/ZnO thin-film measurements. The system is also equipped with highly-accurate calibration mechanics that enable it to operate in any environment, from cleanroom to laboratory. F20 is an enabling piece of wafer testing and metrology technology that has revolutionized the industry. With its powerful hardware and intuitive software, the system provides an unprecedented level of performance and accuracy.