Used FRT MicroProf #293606720 for sale

FRT MicroProf is a wafer testing and metrology equipment designed to deliver exacting measurements of wafer characteristics. It boasts a high degree of accuracy and repeatability, with an integrated focus and measurement capability. The system utilizes a probe station for wafer testing - it is able to mount and image devices on the wafer, and measure their electrical characteristics. The probe station is connectable to most test and measurement instruments, and comes with the ability to control multiple devices simultaneously. MicroProf also includes a stage for making measurements of the wafer characteristics. This stage has a pitched and yawed motorized mechanical positioning unit, which allows for precise adjustments and great versatility in the measurements that can be taken. It also has a motorized Z-axis drive, which provides precise measurements and a more accurate analysis. For metrology, the machine utilizes a high-resolution inspection/metrology microscopy tool. This asset is able to capture images of the wafer, measure features, and carry out 3D visualization. The microscopy model is upgraded with a high-mass sensor, which ensures precise and repeatable measurements. The equipment also includes optical scatterometry, which is used to measure the thickness, refractive index, and shape of small surface feature on the wafer. The scatterometry has an automated calibration system, which is essential for maintaining precise and repeatable measurements. Finally, the unit also has a data acquisition and monitoring software package. This allows users to monitor and record all the measurements, as well as generate reports and analyze the data. In conclusion, FRT MicroProf is a powerful tool for precise and repeatable measurements of wafer characteristics. Its superior mechanical and optical capabilities, combined with its high-resolution inspection/metrology microscopy machine, make it an effective and efficient choice for wafer testing and metrology.