Used FSM / FRONTIER SEMICONDUCTOR 900TC-VAC #197464 for sale

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FSM / FRONTIER SEMICONDUCTOR 900TC-VAC
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ID: 197464
Wafer Size: 8"
Integrated metrology annealing chamber, 8".
FSM (FRONTIER SEMICONDUCTOR) FSM / FRONTIER SEMICONDUCTOR 900TC-VAC is an advanced wafer testing and metrology system, designed to facilitate laboratory and inline operations for process control monitoring and advanced failure analysis. It is suitable for use in advanced technology nodes, ranging from 28nm to 300nm on all substrate materials. FSM 900TC-VAC is versatile and highly customizable, offering a suite of transferable solutions with an extensive range of tool configurations to match the application. Its modular design allows it to easily integrate into existing cleanroom infrastructure, making it easily deployable. The system utilizes a comprehensive suite of metrology, testing and imaging capabilities, including a high-speed DC tester, optical profiler, automated microscope and automated particle counter/analyzer, all housed in an armored and environmentally sealed housing. The metrology tools on FRONTIER SEMICONDUCTOR 900TC-VAC are capable of measuring a broad range of electrical and topographical parameters, including resistivity, capacitance, thickness and topography. It has a wide dynamic range and can measure samples with a thickness ranging from 2 microns to 10mm with high resolution and repeatability. It has an integrated simulator and automated sample handling capabilities to allow for fast and reliable testing in challenging high-volume production environments. The advanced imaging capabilities of 900TC-VAC can be used for a wide range of failure analysis. It is equipped with an automatic imaging station, enabling automated feature recognition, thinning, and digital imaging. The on-board imaging module can be further configured to be compatible with a range of optical inspection methods, such as Fluorescence microscopy, Microfocus X-ray, and SEM/EDX. FSM / FRONTIER SEMICONDUCTOR 900TC-VAC is user-friendly, featuring an intuitive graphical user interface and offers an extensive selection of data extraction and analysis capabilities. It is a highly reliable system, with over-temperature protection, over-voltage protection, and ESD protection to safeguard the device from potential damage. It can also be integrated with a wide range of peripheral accessories, such as sample transfer robots and environmental chambers for additional round-the-clock testing and monitoring. Additionally, FSM / FRONTIER SEMICONDUCTOR offers comprehensive customer support and service contracts to further ensure operational constantly and reliability.
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