Used FSM / FRONTIER SEMICONDUCTOR Laminar Flow Series II #69187 for sale

FSM / FRONTIER SEMICONDUCTOR Laminar Flow Series II is a robust, innovative, and highly precise wafer testing and metrology equipment specifically designed for advanced semiconductor applications, such as microelectronic testing, 3D integration and metrology, wafer fabrication and wafer cleaning. It offers complete solutions with the latest features and functionalities at competitive prices. The Series II includes a modular, scalable system tailored to the needs of each application, with options ranging from basic manual operations to fully automated, advanced tests with real-time monitoring and complete fault diagnostics. The modular nature of the unit allows full integration with production line, network, and utility platforms, providing complete visibility and control of the process from start to finish. The Series II employs a laminar flow design, where air is drawn through the wafer surface via a series of vacuum fans and small channels. This allows for closely controlled environmental conditions, reducing contamination risks and maximizing test accuracy. To ensure the best accuracy, the machine is designed with the ability to sample from both pieces of the wafer simultaneously, providing extremely accurate position tracking and a comparison of sample results. The Series II also features advanced software solutions for data analysis and machine learning, enabling optimization and discovery of previously unknown parameters. These features are also integrated into the workflow and communications systems, allowing for remote access and sharing of data sets with other processes. To enable the highest accuracy and precision, the Series II also uses advanced optical analysis solutions, such as confocal microscopy, interferometry, optical characterization, and scanning microscopy. These solutions allow researchers to conduct in-depth analysis of structures down to the nanometer scale, with extremely high accuracy and repeatability. In summary, FSM Laminar Flow Series II wafer testing and metrology tool is an innovative and powerful asset for testing applications at a range of scales, from the nanometer level to full-scale production. It provides full integration into production line, network, and utility systems, a laminar flow design for contamination control, and advanced software solutions for data analysis and machine learning. It also features optical analysis solutions to facilitate precision and accuracy in research, testing, and production.