Used KLA / TENCOR 7700 Surfscan #158595 for sale

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KLA / TENCOR 7700 Surfscan
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ID: 158595
Wafer Size: 8"
Wafer inspection system, 8" Can accommodate wafers from 2 to 8" dia. Sensitivity - Particle: .117 micro-meter dia. latex spheres with >90 percent capture rate Haze: 1 ppm minimum Cassette to cassette handling Detects defects as small as 0.15 µm Defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films.
KLA / TENCOR 7700 Surfscan is a wafer testing and metrology equipment that offers a reliable and powerful solution for wafer surface quality control. This system includes a high-throughput optical microscope that offers high resolution imaging, automated inspection and rapid data analysis. With an impressive field of view of up to 20 mm, this unit allows for quick and accurate scanning of entire wafer surfaces. KLA 7700 Surfscan uses several advanced technologies to ensure high-quality performance. It has an integrated strobed laser machine, which provides detailed high-definition imaging of the wafer surface in both brightfield and darkfield imaging modes. This tool also utilizes several advanced algorithms for automated defect detection and classification. Additionally, TENCOR 7700 Surfscan offers a wide range of automated metrology capabilities, including on-wafer focus, critical dimension measurements, edge and edge profile measurements, 3-dimensional measurements and much more. 7700 Surfscan also offers a reliable and easy-to-use software platform. This software provides an intuitive user interface, automated defect review capabilities and powerful data analysis tools. In addition, this asset has network connectivity and data transfers to make the management of the wafer testing and analysis databases easier. Quality control data can then be sorted and analyzed to provide real-time feedback on the performance and reliability of the wafer surface. Overall, KLA / TENCOR 7700 Surfscan is a robust and high-quality wafer testing and metrology solution. Its advanced imaging and detection technology, coupled with its intuitive software platform and robust network connectivity, makes this model an invaluable asset in any wafer testing and analysis environment. With its powerful performance and user-friendly design, KLA 7700 Surfscan provides a reliable and efficient solution for ensuring the quality and reliability of wafers in both research and industrial applications.
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