Used KLA / TENCOR 7700 Surfscan #9011192 for sale

KLA / TENCOR 7700 Surfscan is a compact, highly accurate, wafer testing, and metrology equipment, suitable for nanometer device fabrication. It uses advanced multi-sensor technology to deliver a number of critical measurements including topography, overlay, focus, and film thickness measurements. Its precision and accuracy enable it to be used for a variety of applications, such as for R&D, qualification, production, and quality control. KLA 7700 Surfscan is designed to accommodate a wide range of substrates, including semiconductors, optics, and MEMS devices. It features an Anti "Optical Reflection" (AR) coated stage that allows for precise surface measurements, even in the presence of strong reflections. An integrated Autofocus feature ensures consistent and repeatable measurements. Its high sensitivity and resolution can be used to detect small defects, such as particles or scratches on the substrate, that can affect the device's functionality. TENCOR 7700 Surfscan provides several user-configurable measurement settings that can be utilized to optimize its performance. Among these settings are the microscan delay, scan area, and measuring range. The system is highly efficient and flexible, allowing users to maintain their processes continuously. It also includes data surveillance features which allow continuous monitoring of different parameters, and can alert users when a process or performance is beyond the expected parameters. 7700 Surfscan can also be integrated with various metrology systems, providing customers with a complete solution for their wafer testing and metrology needs. It is compatible with a range of 3rd party sensors, including laser confocal, force, and reflectance microscopes, making it easy to use and customize to match a customer's application. The unit also contains a range of data analysis tools to help users make more complex measurements, as well as verify and analyze the results of their processes. It features a fully automated data logging feature, enabling users to store and analyze data for reporting and archiving purposes. The machine is powered by Windows operating tool, and features a user-friendly, intuitive graphical interface, making it simple to use and easy to learn. In summary, KLA / TENCOR 7700 Surfscan is a versatile, ergonomic, and feature-rich wafer testing and metrology asset, that can be used for a variety of applications. It provides a reliable, high-precision solution that can improve process performance and optimize results. Its automated data logging and data analysis features make complex measurements more manageable, making it a powerful tool for wafer testing and metrology.