Used KLA / TENCOR 7700 Surfscan #9227853 for sale

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KLA / TENCOR 7700 Surfscan
Sold
ID: 9227853
Vintage: 1995
Inspection system 1995 vintage.
KLA / TENCOR 7700 Surfscan is a wafer testing and metrology equipment used in the semiconductor industry for the optimal measurement and characterization of chips. The system is capable of measuring the topography of advanced semiconductor wafers, dies, and thin films with high accuracy and precision. KLA 7700 Surfscan unit features a suite of metrology tools that provide process optimization and defect detection. These include Contour Trac ultra-resolution profile inspection, multi-wavelength scatterometry for feature profile and film measurements, and automated defect classification. This machine utilizes CCD imaging, piezo stages, and UV-enhanced optics to deliver high-precision measurements. TENCOR 7700 Surfscan uses a unique software architecture that ensures a higher level of performance and stability. This architecture consists of a fully integrated image-processing platform that includes user-friendly setup tools to easily configure the tool per the user's requirements. The asset's fully integrated user interface provides direct access to all measurement parameters. This user interface also facilitates the communication with other process control systems. Additionally, 7700 Surfscan model has an automated defect classifier that improved defect detection capabilities. The automated defect classifier utilizes advanced pattern recognition algorithms to recognize a variety of defect signatures with superior accuracy. This classifier also offers a flexible user-definable library to enable users to customize their defect detection strategy. KLA / TENCOR 7700 Surfscan wafer testing and metrology equipment not only offers advanced metrology capabilities to help improve process optimization, but also provides faster automation of the inspection process. The system's advanced hardware and software technologies ensure high reliability and accuracy of results for the ultimate improvement of production yields.
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