Used KLA / TENCOR AIT 8010 #80434 for sale

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ID: 80434
Wafer Size: 8"
Vintage: 1998
SURFSCAN Defect inspection system, 8" Crated and stored in a warehouse 1998 vintage.
KLA / TENCOR AIT 8010 is a state-of-the-art wafer testing and metrology equipment used for developments in the semiconductor industry. It combines advanced metrology capabilities with automated wafer testing, making it an ideal tool for monitoring multiple processing stages and improving product yield. KLA AIT 8010 is based on the k-Space Metrology (KSM) platform which employs high-resolution, non-contact laser interferometry to measure 3D Warp/CDH (Width, Height, andRadial) topography. KSM technology gives the system a highly accurate and repeatable measuring range, with a maximum traceable precision of 0.5nm. This enables the precise measurement of wafer surface information, which is then analyzed to provide invaluable insights on microstructural changes during different process steps. It also offers excellent automation capabilities, allowing countless wafers to be tested quickly and easily. The unit comes with a fully automated speed positioning machine to ensure fast and accurate operation, as well as a fully automated sample manipulation tool to ensure precise sample placement. Advanced imaging is enabled by an adjustable bright field optical asset that provides high speed, high resolution imaging and quantitative defect analysis. In addition, TENCOR AIT 8010 is built with a robust multi-user data management model that syncs with a secure web-based server, providing easy access, sharing, and storage of data. This allows for seamless collaboration, with simultaneous access to data from workstations located all around the world. Overall, AIT 8010 is an all-in-one wafer testing and metrology equipment that combines advanced technologies with automated processes to help maximize wafer performance and quality. It is a powerful solution designed to meet the demanding requirements of today's semiconductor technology.
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