Used KLA / TENCOR AIT UV #9161154 for sale

KLA / TENCOR AIT UV is a highly specialized wafer testing and metrology equipment designed for inspecting and measuring critical features found on semiconductor wafers. This wafer testing system is equipped with ultraviolet laser sources and advanced optics to allow for fast, accurate, and reliable inspections of wafer surfaces. KLA AIT UV unit is comprised of two main subsystems: a four-port UV laser source, and an automated scanning machine. The four-port UV laser source provides custom real-time illumination of the wafer, which can be used to evaluate the topography of the wafer's surface. The automated scanning tool then moves the laser source across the wafer surface to precisely measure critical features. The imaging asset uses a highly sensitive charge-coupled device (CCD) camera to capture images of the wafer's surface. This data is then processed with proprietary algorithms to precisely measure the height, size, and shape of the features found on the wafers. TENCOR AIT-UV model is certified with several industry-standard protocols, including TALYS (Test Automation Language for Yield Systems), a widely used wafer metrology method. This provides users with confidence that the equipment will accurately measure critical features, which are essential to the continued development and manufacture of integrated circuits. AIT UV system also provides advanced reporting capabilities, which can provide detailed data on the wafer's measurements, and results can be processed and shared securely over the internet. This ensures that process engineers and other personnel can access the most up-to-date information, regardless of their location. TENCOR AIT UV is a valuable tool for wafer testing and metrology, and can provide fast, accurate, and detailed measurements of critical features found on semiconductor wafers. This technology can provide important insights that can help engineers ensure product reliability and improve the production process.