Used KLA / TENCOR AIT #9190534 for sale

KLA Advanced Inspection Technology (KLA / TENCOR AIT) is a wafer testing and metrology equipment used to identify and characterize metrology of defect-causing features on a wafer. The system captures high resolution images using fully automated robotic systems. It then uses pattern recognition algorithms to detect subtle shapes and patterns in the images, offering a more holistic picture of the wafer, ideal for defect detection and characterization. KLA AIT unit can operate at any dimensional layer and up to 200mm wafers. It also has low failed wafer rate and improved yields. This machine enables customers to improve product quality and yields with the capture and analysis of defect images in real time through its high resolution output. TENCOR AIT tool provides a cost-effective solution to improve fab productivity, reduce inspection cycle time, and total milling and grinding time. AIT asset has an intuitive user interface which simplifies wafer inspection. It can collect minute photomicrographs of defects and provide customers with images and classification information. The model can also identify whether a defect falls within a certain size range and identify subtle shapes to classify defects according to their attributes. KLA / TENCOR AIT equipment opens up doors to improved defect detection and characterization. It can be used for device and process qualification, process sustainability, failure analysis, die-lot yield estimation and false-alarm reduction. TENCOR proven wafer testing and metrology system is equally reliable across many customer applications. KLA AIT unit is a highly specialized and easy to use process controller, with precision accuracy, capable of detecting even the smallest defects. The machine has been designed to provide reliable, repeatable results with minimal variation in testing and metrology results. Additionally, the tool is designed to protect customer data and ensure privacy by managing authentication tokens and secure data transfer processes. KLA / TENCOR advanced inspection technology offers wafer testing and metrology solutions that enable fabs to enhance node uniformity, reduce product yield and optimize device and process performance. With TENCOR AIT asset, customers can significantly reduce scrap rates, rejections, and process drift, and improve the cost performance of their fabs.