Used KLA / TENCOR Alpha Step 500 #293816165 for sale

KLA / TENCOR Alpha Step 500 is one of the leading wafer testing and metrology systems in the market - designed for the highest precision measurements and accuracy of up to one angstrom, KLA Alpha Step 500 is engineered for superior defect detection. The equipment was designed with a core OmniScan technology platform that allows for the testing of both front and back sides of a wafer and the detection of minute defect sizes and defects associated with emerging technologies such as nanometer-scale devices. TENCOR ALPHASTEP 500 offers a highly efficient and fast wafer patterning solution and provides excellent defect detection and measurement accuracy. The system applies a multi-angle reflectance imaging technique to accurately measure the 3D geometry of test source patterns, allowing for some of the highest levels of defect detection accuracy available, including the identification of both single- and double-stranded defects. Additionally, the unit provides precision measurements and reliable results with repeatable measurements and a low noise figure, ensuring accurate results with each test. The machine is equipped with a variable pressure contact tool that ensures that only a minimal amount of force is applied to the specimen during testing. This helps to decrease the potential for artefacts and ensures that the test results are reliable and accurate. Alpha Step 500 is also optimized for both top-down and cross section sample inspection and includes a powerful software suite to enable adequate control and quickly assimilate measurement information into the user's database. KLA / TENCOR ALPHASTEP 500 platform also offers a range of exclusive applications to provide an ideal solution for measuring the kinematic properties of a wafer, such as stress waveform analysis and thin film stress measurement. The asset can also be used for particle sizing, particle characterization, and advanced pattern recognition applications. In conclusion, ALPHASTEP 500 provides an advanced, high-throughput wafer testing and metrology model that offers superior detection accuracy as well as a range of advanced applications. With an intuitive user interface and fast scanning capabilities, it's an ideal solution for precision wafer testing and metrology laboratories.