Used KLA / TENCOR ASET F5x #9291766 for sale

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ID: 9291766
Wafer Size: 8"-12"
Vintage: 2001
Film thickness measurement system, 8"-12" 2001 vintage.
KLA / TENCOR ASET F5x is a wafer testing and metrology equipment that has been specifically designed to provide users with reliable, high-precision and ultra-fast results. It offers a combination of surface testing and optical inspection capabilities, all within a single integrated system. At the heart of the unit is the advanced KLA ASET-F5X optical machine, which enables users to obtain top-notch images of the target surface with a high degree of accuracy. This tool utilizes a combination of advanced optical elements to detect and distinguish features, and has a number of features that can support a wide range of wafer applications. The asset is also equipped with a high-precision motion model that allows for precise and repeatable positioning of the target wafer. This motion equipment is capable of accurately scanning and probing the surface of the wafer with precise speed and repeatability. This ensures that the scanning results are always consistent and reliable. TENCOR ASET F 5 X also provides users with a variety of metrology data that can be used to evaluate the quality and integrity of the target wafer. This includes data from optical metrology, such as particle counting, pattern recognition, surface roughness, focus, profiles, auto-focus, and shape measurements. Additionally, the system can provide users with the necessary information to perform materials characterization, such as stress and micro-strain measurements. Finally, KLA / TENCOR ASET F 5 X unit is capable of performing a variety of particle detection and cleanliness tests to ensure that the wafer is free from harmful particles. This ensures that the wafer meets any necessary safety or quality standards. KLA ASET F 5 X is an all-in-one wafer testing and metrology solution that provides users with fast and reliable results. This machine is capable of providing users with accurate and detailed results from optical and metrology tests, providing information that is used to determine the integrity of the wafer. Additionally, this tool is equipped with a high-precision motion asset and can perform various particle detection and cleaning tests to ensure that the wafer is free of any unwanted particles.
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