Used KLA / TENCOR D-120 #9119137 for sale

KLA / TENCOR D-120 is a wafer testing and metrology equipment designed to provide accurate information on device structure and electrical performance on a wide range of materials, including III-V, Si, Ge, and Compound Semiconductors. The system offers multi-technique capability, with manual and automated test capabilities, as well as multiple imaging capabilities including high-resolution, infrared, and visible spectroscopic options. KLA D-120 unit is a versatile wafer measurement and inspection tool, offering both manual and automatic testing. Utilizing high-precision optical, electro-optical, and videometric sensors, the instrument can perform a variety of electrical and physical measurements on wide range of materials. The machine has an integrated, computer-controlled subsystem that provides advanced wafer measurement capabilities such as accurately repeatable measurements within a nanometer scales. The tool is equipped with a variety of advanced technologies to ensure accurate testing and metrology results. It is capable of performing contact voltage measurements, temperature dependent resistance measurements, as well as scanning electron microscopy and associated energy dispersive spectroscopy analysis. Additionally, TENCOR D-120 offers the functionality to perform nanoscale pattern alignment and imaging as well as scanning micron-scale images with high spatial resolution. D-120 wafer testing and metrology asset offers a touchscreen-based control model, enabling efficient operation. The equipment comes with bundled KLA software, which enables users to access a variety of features, such as contact printing for device troubleshooting, comprehensive 2-dimensional wafer mapping, as well as a wafer tracking database. KLA / TENCOR D-120 is a comprehensive testing and metrology system, providing abundant in-process and post-process analysis capabilities. By leveraging advanced technologies such as scanning electron microscopy and contact voltage measurements, as well as exhaustive data gathering capabilities and intuitive software interface, this unit offers highly accurate wafer measurements and inspection solutions for performance, reliability, and design.