Used KLA / TENCOR P1 #171037 for sale

KLA / TENCOR P1 is an automated metrology and wafer testing equipment designed for the semiconductor fabrication process. It enables the rapid evaluation and analysis of the structural features of photomasks and wafers, providing workers in the industry with greater accuracy and precision than what could be achieved manually. The built-in components of the system make use of metrology techniques, like 2D and 3D optical inspection and scatterometry, as well as wafer-level testing and electrical yield analysis. The combination of these two technologies allows the unit to inspect and analyze both the physical and electrical properties of wafers. The machine is capable of analyzing patterns down to a resolution of 10nm, and can be used in both front and backside inspection of wafers, enabling precise visual inspection of both layers. This allows for the detection of a variety of defects in the wafer, such as delaminations, contamination, chips, and scratches. KLA P-1 also incorporates advanced signal processing to improve the accuracy of test results. The tool collects and stores data from dozens of points on the wafer, allowing users to track properties such as electrical resistance and signal integrity with greater accuracy than ever before. The asset features an easy-to-use touch screen interface, allowing users to quickly and accurately make adjustments to the model settings or perform data analysis tasks. Advanced features such as automatic data collection and report generation can be easily enabled or disabled with just a few clicks. In addition to its metrology and wafer testing functions, TENCOR P 1 also provides an integrated fabrication process control equipment, which allows users to monitor the quality of their products as they are being made. This system can alert users to potential problems as they arise, enabling them to take corrective action quickly and efficiently. P1 offers enhanced flexibility and precision compared to traditional testing and metrology systems, making it the ideal solution for semiconductor factories and other technology-centric industries. By simplifying the process of testing and monitoring wafer production, this unit helps to significantly reduce production costs while conserving resources and improving yields.