Used KLA / TENCOR P15 #9103024 for sale

KLA / TENCOR P15 is a wafer testing and metrology equipment designed to provide secure, high-accuracy and reproducible results for challenging processes such as IC device development, IC manufacturing and other specialized applications. The system is capable of providing accurate, repeatable measurements on any size, shape or geometry of microprocessors, DRAMs, FPGAs and other semiconductor devices. It is designed to enable semiconductor engineering, process research, yield optimization and wafer-level diagnostics. KLA P-15 unit features state-of-the-art technologies such as full-field imaging with measurement and observation capabilities, automated feature recognition and defect detection, and fully automated in-situ photomask inspection. The machine contributes to the reliable, repeatable and accurate inspection of quickly evolving market structures, device geometries and process variables. TENCOR P 15 consists of a versatile and high-precision optical platform with a set of objectives, cameras and illumination sources.It is highly accurate with a 16-bit measurement resolution, providing precise results in a variety of applications, from device development and defect inspection to metrology. Additionally, the tool includes a camera head, an optical microscope, and a control asset on a single platform to allow for easy integration and operation. The model also includes a broad range of measurement and analysis packages, including signal analysis, focus testing, overlay measurement and a full suite of metrology software bundles to ensure complete control of each wafer's performance. In addition, a selection of high-speed hardware peripherals is available to improve accuracy and discover subtle defects. Overall, TENCOR P15 is designed to provide reliable, accurate and repeatable measurements across multiple processes, geometries, sub-processes and device configurations. TENCOR P-15 equipment is an ideal tool for semiconductor fabrication, as well as IC design, development and characterization. By providing accurate measurements and real-time control, KLA P15 has proven to be a beneficial tool in helping to make wafer-level decisions and solutions more quickly than ever before.