Used KLA / TENCOR P15 #9254109 for sale

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KLA / TENCOR P15
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ID: 9254109
Wafer Size: 8"
Long scan profiler, 8" Upgraded from P11 Computer controlled Automatic measurement capability Measurement of vertical features: 100 Å (0.4 min) to ~300 µm (11 mils) With vertical resolution: 0.5, 2 / 10 Å Includes: Semiconductor wafers Thin film heads Precision machined and polished surfaces Ceramics for microelectronics Glass for flat panel displays Optical surfaces.
KLA / TENCOR P15 is a market leading wafer testing and metrology equipment for semiconductor manufacturers. It is suitable for use in a broad range of applications, allowing for automated and high-precision measurements of samples with feature sizes from the most advanced nodes down to those of 200mm wafers. KLA P-15 offers various performance capabilities to maximize throughput and accuracy. The system offers world-class precision, with a 2D overlay accuracy of up to +/- 2.5nm and a 1D CD uniformity of up to +/- 1.5nm. The inspection capabilities of the unit also include advanced algorithms for defect detection, with best in class data throughput. Integrated with optical and acoustic sensors, TENCOR P 15 provides high speed measurements and offers the highest accuracy, enabling users to perform multiple measurements and analyze data with great precision. Also, the machine incorporates powerful data processing and reporting capabilities, and offers the flexibility to be deployed in the most demanding manufacturing environments. P15 also enables the measurement of a broad range of wafer parameters and surface characteristics. These include inter-particle gap measurements, flatness measurements, stress measurements, line width measurements, puncture size measurements, and more. Furthermore, it has the capability to perform in-depth dimensional analysis, allowing for faster problem resolution and less downtime. Additionally, the tool is highly versatile and can be fully adapted to meet the unique needs of each customer. The asset's flexible design allows for quick changeover and configuration with ease, allowing for maximum production cycle time and minimized run time. KLA also provides technical support for TENCOR P-15, ensuring that customers have access to experts for technical advice, troubleshooting, and periodic maintenance. In conclusion, P 15 is an innovative wafer testing and metrology model, offering the highest accuracy and best throughput when measuring the most complex wafer characteristics. With its robust design and advanced capabilities, KLA / TENCOR P-15 provides a great solution to the needs of today's semiconductor manufacturers.
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