Used KLA / TENCOR P20 #184141 for sale

KLA / TENCOR P20 is a wafer testing and metrology equipment that enables accurately measuring parameters essential for wafer process control. The system is designed for semiconductor manufacturing, digital signal processing, medical devices and other high-performance optical metrology applications. The unit has a number of distinct features that make it suitable for evaluating a wide range of semiconductor wafers. At the core of the machine is the PixThinTM image sensor array, which offers high resolution and outstanding signal-to-noise ratio, as well as wide dynamic range. The sensor captures and stores images at speeds unmatched by any other tool on the market. This enables reliable and precise testing of a variety of wafer features, such as doping levels, geometry, line widths and tilt, with minimal risk of error. Another key feature of KLA P-20 is its Micro TrackTM software, which enables precise control and measurement of wafer features. The software measures wafer features down to nanometer accuracy, along with line widths, layer thickness, and more. It is also capable of accurately capturing and analyzing a wide range of wafer shapes, such as flat, rectangular, curved, and elliptical wafers. The asset also has an advanced Low Temperature Measurement model, allowing for precise metrology even at cryogenic temperatures. This is essential for applications that require nanometer-level accuracy and repeatable results, such as testing the accuracy of a manufacturing process or controlling digital signal processing devices. TENCOR P 20 can be used for a range of applications, from wafer testing for semiconductor fabrication to wafer testing for digital signal processing devices. Its high accuracy, speed, and reliability make it ideal for ensuring quality control and reliable results. Its range of features makes it an ideal choice for a variety of applications, whether it is used to measure doping levels or verify signal integrity.