Used KLA / TENCOR FT-750 #148761 for sale

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KLA / TENCOR FT-750
Sold
ID: 148761
Wafer Size: 6"
Film thickness measurement system, 6" Missing PC monitor Powered down in a clean room.
KLA / TENCOR FT-750 is a powerful wafer testing and metrology equipment designed for the precise characterization and testing of semiconductor devices. The system is equipped with three separate modules: KLA FT-750 Operating Unit, TENCOR FT 750 Metrology Machine, and FT 750 Analysis Module. FT-750 Operating Tool is responsible for the overall setup of the wafer testing operation. It includes a suite of software tools that simplify the programming process and enable users to quickly and easily configure the exact requirements of the wafer test operation that they wish to perform, such as specifying the type of analysis to be performed, the parameters to be measured, the physical layout of the testing environment, and other relevant details. The asset conveniently stores all settings and parameters associated with the chosen test operation and allows for easy customization and modification of the test setup. TENCOR FT-750 Metrology Model is the main testing component of the equipment and is responsible for both physical and electrical measurements of the wafer material. Its measurement capabilities include testing for critical features such as: gate oxide thickness, gate leakage current, gate capacitance, gate resistivity, gate voltage, and gate capacitance. It also has the capability to measure device yield, device failure rate, wafer fatigue, and wafer leakage rates. This system is highly precise, allowing for a high level of detection sensitivity and accuracy when measuring physical and electrical parameters of the wafer material. Finally, KLA / TENCOR FT 750 Analysis Module is a powerful data processing and analysis capability that allows users to quickly analyze the results of their testing operations. It can be used to analyze the overall trends and correlations between the various measured physical and electrical properties of the wafer material, as well as to detect outliers or abnormal measurements. This analysis tool can provide detailed information about the quality of the wafer material and is essential for optimizing production output and product quality. Overall, KLA FT 750 wafer testing and metrology unit is an effective and complete solution for precise characterization and testing of semiconductor devices. The machine is able to measure and analyze various physical and electrical parameters of the wafer material with a high level of accuracy and sensitivity, and with the powerful data analysis capabilities of KLA / TENCOR FT-750 Analysis Module, users are able to quickly examine the results of their testing operations and identify abnormal readings or trends. This versatile tool is a valuable tool for any semiconductor-testing operation.
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