Used KLA / TENCOR / PROMETRIX Omnimap RS-55TC #9276304 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-55TC is an automated wafer testing and metrology equipment that uses an advanced optical detection technology to test the quality of a wafer during and after its manufacturing process. The system is designed for inspecting wafers up to 200mm in size and for measuring features down to 0.25um. This unit uses chromatic confocal scanning technology to create high resolution 3D maps of the wafer and accurately measure the height of features across the wafer, and optical interference imaging for fast inspection of flatness and wafer macro-topography. The machine also features a cross-sectional roughness metrology tool that utilizes a motorised XY subsystem and laser diode light source to achieve hybrid surface morphological measurements with a resolution of 0.5μm. The asset is designed to be fully automated and integrated into a production environment, with an automated wafer handling model and a wide range of wafer interaction options. The equipment also provides industrial grade process control capabilities, allowing for the monitoring of multiple processes and providing feedback to maintain optimal process conditions. The system provides real-time wafer quality assessments and can be used to identify defects and monitor process uniformity. Additionally, the unit provides advanced data-driven analytical reporting features to help identify process trends that can be used for continuous improvement. The RS-55TC can provide different test results depending on the specific application as it is pre-programmed with wafer inspection and metrology software. It can be programmed to process wafers made from different materials such as silicon, gallium arsenide, and silicon carbide. The machine also incorporates a Smart Binning algorithm which can identify qualified wafers and ensure good yields. In summary, KLA OMNIMAP RS-55/TC is an automated wafer testing and metrology tool which is designed to meet the needs of the global semiconductor market. The asset uses advanced optical detection technology to measure features down to 0.25um and provides industrial grade process control capabilities to maintain optimal process conditions. It is capable of providing different test results for different applications and materials, and incorporates a Smart Binning algorithm to improve yield and reduce the risk of waste in production.