Used KLA / TENCOR / PROMETRIX UV 1050 #146354 for sale

KLA / TENCOR / PROMETRIX UV 1050 wafer testing and metrology equipment is an innovative tool designed to improve accuracy and precision of wafer analysis and characterization. This system is ideal for high-tech industries such as semiconductor fabrication, memory device manufacturing and micro-electromechanical systems (MEMS). KLA UV 1050 is a sophisticated error detection and repair unit designed to provide greater speed and accuracy than traditional testing machines. It utilizes a variety of state-of-the-art technologies to achieve the highest levels of accuracy and precision. It is a full wafer review machine that contains several high-end components. The first component is the DMD3000 tool, which is a fully automated digital image sensing and analysis device. This device uses a laser-based imaging and analysis method to examine the entire wafer surface and detect defects quickly and accurately. The DMD3000 also has a fast trigger-level asset, which is ideal for detecting errors quickly and efficiently. Another major component of TENCOR UV-1050 is the MMD3000 model. This equipment utilizes a multiple probe imaging, pattern recognition and auto analysis system to aid in wafer characterization. The MMD3000 further aids in precision alignment and traceability orientations, while its integrated CAD capabilities help ensure that designs and measurements can be accurately compared. The control and analysis software, in addition to the innovative inspection unit, contributes to the accuracy of UV 1050. It provides automated application-specific detection and analysis capabilities, as well as automated data analysis and reporting. The machine also comes with a comprehensive set of advanced data formatting and visualization tools, which provide comprehensive data analysis for wafer characterization and metrology. In summary, PROMETRIX UV 1050 tool is a state-of-the-art wafer testing and metrology asset designed to provide greater accuracy and precision in testing and characterization of semiconductor and other high-tech industry elements. Its combination of advanced imaging, analysis, control and software components allows for quick and accurate defect detection, while its comprehensive data analysis and reporting capabilities ensure the accuracy of the results.