Used KLA / TENCOR / PROMETRIX UV 1080 #9231980 for sale

KLA / TENCOR / PROMETRIX UV 1080 is a wafer testing and metrology equipment that uses advanced ultraviolet imaging technology. This system is designed to perform specialized metrology tasks on wafers that have been exposed to ultraviolet radiation. This unit is capable of automatically inspecting and classifying a full wafer in minutes, ensuring accurate and consistent classification. The core technology behind the machine utilizes ultraviolet imaging to measure and grade the wafer surface. UV imaging utilizes multiple UV wavelength bands to accurately capture microscopic variations in the wafer surface. The imaging tool captures the data from the wafer in each band and is capable of distinguishing individual particles, defects, and micro-structures. The acquired images are compared against wafer pattern databases to accurately classify the wafer. The asset also includes an automated defect location and mapping model that rapidly detects and records defective areas of the wafers surface. This equipment utilizes a special algorithm to identify common defect types such as flat line edges, splashing, fine particle contamination, and delaminations. The defect map allows the user to quickly understand the characteristics of the wafer and easily analyze it for further analysis. KLA UV 1080 also includes a wafer scanning system. This unit includes a high resolution microscope lens and a scanning stage that moves up and down the wafer surface at specified intervals. This machine is capable of collecting large amounts of data which is then processed by an automated feature extractor. Feature extractors allow users to quickly identify flaws, defects, and other characteristics of the wafer surface. The tool is also equipped with advanced feature analysis software that enables the user to identify and analyze microscopic features and differences within the wafer. This feature analysis includes customized feature extraction, feature comparison analysis, and feature intensity analysis. This software provides users with the ability to accurately identify and classify defects, particles, and other characteristics on the wafer surface. TENCOR UV-1080 provides users with the precise data needed for accurate metrology tasks on wafers exposed to ultraviolet radiation. This asset utilizes advanced ultraviolet imaging technology, automated defect location and mapping, and powerful feature analysis to quickly and accurately classify wafers. The model's data collection capabilities and feature analysis software enable the user to gain an in-depth understanding of the wafer surface, enabling them to take appropriate action to ensure accuracy in their metrology operations.